리눅스 하드디스크 점검 유틸리티
스마트모니터툴로 운영중인 하드디스크 상태를 확인 할 수 있습니다.
운영중인 서버의 두번째 디스크인데 상태가 안좋아서 사용하지 않고 있는 하드디스크입니다.
# smartctl -a /dev/sdb 로 상태를 체크했는데 문제로 보이는 항목입니다.
Raw_Read_Error_Rate <= 디스크에서 읽기 실패, 소프트웨어적인 오류
Reallocated_Sector_Ct <= 섹터에 문제가 있어 다른영역으로 치환된 횟수
위 처럼 오류가 있다면 배드섹터를 체크해 보세요~
# badblocks -wsv /dev/sdb
Checking for bad blocks in read-write mode
From block 0 to 976762583
Testing with pattern 0xaa: 0.10% done, 2:38 elapsed
-w 옵션은 쓰기모드이므로 기존 데이터가 지워집니다.
비파괴 검사를 하려면 -n 을 주세요.
아래는 smartctl 전체 내용입니다.
# smartctl -a /dev/sdb
smartctl 5.43 2012-06-30 r3573 [x86_64-linux-2.6.32-431.17.1.el6.x86_64] (local build)
Copyright (C) 2002-12 by Bruce Allen, http://smartmontools.sourceforge.net
=== START OF INFORMATION SECTION ===
Model Family: Hitachi Deskstar 7K1000.D
Device Model: Hitachi HDS721010DLE630
Serial Number: MSK523Y202D35C
LU WWN Device Id: 5 000cca 37fc03e15
Firmware Version: MS2OA610
User Capacity: 1,000,204,886,016 bytes [1.00 TB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Device is: In smartctl database [for details use: -P show]
ATA Version is: 8
ATA Standard is: ATA-8-ACS revision 4
Local Time is: Fri Mar 10 11:29:59 2017 KST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: FAILED!
Drive failure expected in less than 24 hours. SAVE ALL DATA.
See vendor-specific Attribute list for failed Attributes.
General SMART Values:
Offline data collection status: (0x84) Offline data collection activity
was suspended by an interrupting command from host.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 7361) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 123) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000b 002 002 016 Pre-fail Always FAILING_NOW 3948150783
2 Throughput_Performance 0x0005 068 068 054 Pre-fail Offline - 2076
3 Spin_Up_Time 0x0007 100 100 024 Pre-fail Always - 205
4 Start_Stop_Count 0x0012 100 100 000 Old_age Always - 7
5 Reallocated_Sector_Ct 0x0033 001 001 005 Pre-fail Always FAILING_NOW 1976
7 Seek_Error_Rate 0x000b 100 100 067 Pre-fail Always - 0
8 Seek_Time_Performance 0x0005 115 115 020 Pre-fail Offline - 34
9 Power_On_Hours 0x0012 095 095 000 Old_age Always - 38464
10 Spin_Retry_Count 0x0013 100 100 060 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 7
192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 381
193 Load_Cycle_Count 0x0012 100 100 000 Old_age Always - 381
194 Temperature_Celsius 0x0002 150 150 000 Old_age Always - 40 (Min/Max 20/45)
196 Reallocated_Event_Count 0x0032 001 001 000 Old_age Always - 2102
197 Current_Pending_Sector 0x0022 100 100 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0008 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x000a 200 200 000 Old_age Always - 0
SMART Error Log Version: 1
ATA Error Count: 311 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 311 occurred at disk power-on lifetime: 37261 hours (1552 days + 13 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
10 51 08 3f 00 00 00 Error: IDNF at LBA = 0x0000003f = 63
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
ca 00 08 3f 00 00 e0 08 5d+04:35:46.742 WRITE DMA
35 00 08 3f 00 44 e0 08 5d+04:35:40.691 WRITE DMA EXT
35 00 08 3f 00 44 e0 08 5d+04:35:34.756 WRITE DMA EXT
35 00 08 3f 00 44 e0 08 5d+04:35:34.458 WRITE DMA EXT
35 00 08 f8 48 80 e0 08 5d+04:35:30.949 WRITE DMA EXT
Error 310 occurred at disk power-on lifetime: 37260 hours (1552 days + 12 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
10 51 08 47 21 00 00 Error: IDNF at LBA = 0x00002147 = 8519
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
ca 00 08 47 21 00 e0 08 5d+02:50:47.175 WRITE DMA
27 00 00 00 00 00 e0 08 5d+02:50:47.175 READ NATIVE MAX ADDRESS EXT
ec 00 00 00 00 00 a0 08 5d+02:50:47.172 IDENTIFY DEVICE
ef 03 42 00 00 00 a0 08 5d+02:50:47.169 SET FEATURES [Set transfer mode]
27 00 00 00 00 00 e0 08 5d+02:50:47.169 READ NATIVE MAX ADDRESS EXT
Error 309 occurred at disk power-on lifetime: 37260 hours (1552 days + 12 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
10 51 08 47 21 00 00 Error: IDNF at LBA = 0x00002147 = 8519
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
ca 00 08 47 21 00 e0 08 5d+02:50:43.296 WRITE DMA
35 00 08 a8 6b 45 e0 08 5d+02:50:24.581 WRITE DMA EXT
35 00 10 98 6b 45 e0 08 5d+02:50:24.557 WRITE DMA EXT
35 00 08 a7 3b 44 e0 08 5d+02:50:06.715 WRITE DMA EXT
35 00 10 97 3b 44 e0 08 5d+02:50:03.638 WRITE DMA EXT
Error 308 occurred at disk power-on lifetime: 37236 hours (1551 days + 12 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
10 51 08 47 21 00 00 Error: IDNF at LBA = 0x00002147 = 8519
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
ca 00 08 47 21 00 e0 08 4d+02:56:47.399 WRITE DMA
27 00 00 00 00 00 e0 08 4d+02:56:47.399 READ NATIVE MAX ADDRESS EXT
ec 00 00 00 00 00 a0 08 4d+02:56:47.396 IDENTIFY DEVICE
ef 03 42 00 00 00 a0 08 4d+02:56:47.393 SET FEATURES [Set transfer mode]
27 00 00 00 00 00 e0 08 4d+02:56:47.393 READ NATIVE MAX ADDRESS EXT
Error 307 occurred at disk power-on lifetime: 37236 hours (1551 days + 12 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
10 51 08 47 21 00 00 Error: IDNF at LBA = 0x00002147 = 8519
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
ca 00 08 47 21 00 e0 08 4d+02:56:43.515 WRITE DMA
27 00 00 00 00 00 e0 08 4d+02:56:43.515 READ NATIVE MAX ADDRESS EXT
ec 00 00 00 00 00 a0 08 4d+02:56:43.512 IDENTIFY DEVICE
ef 03 42 00 00 00 a0 08 4d+02:56:43.509 SET FEATURES [Set transfer mode]
27 00 00 00 00 00 e0 08 4d+02:56:43.509 READ NATIVE MAX ADDRESS EXT
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
아무래도 하드웨어적인 오류가 있는 듯 합니다.
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